Back to the Reliability Math Lab
Sources
Reliability Math Lab is a calculator set. This file says where each formula, constant and preset comes from. Status words: primary (a standard, paper or data sheet says it), model (a standard mathematical model the lab applies), derived (computed by the lab from a primary rule), and teaching value (chosen by the lab to show the shape of an effect, not a published figure). The page labels teaching values as such.
Formulas
| Calculator | Formula | Source | Status |
|---|---|---|---|
| Codeword failure | P(fail) = sum_{k>t} C(n,k) p^k (1-p)^(n-k) |
The binomial distribution: n independent bit errors with probability p each, more than t failing a bounded-distance code | model |
| Parity | BCH parity is about m x t bits, with 2^m - 1 at least the codeword length | The standard binary BCH construction | model |
| UBER | UBER = P(fail) / data bits, one bit error counted per failed codeword |
The lab’s normalization. It is a floor, since a failed codeword leaves several bad bits | model |
| AFR | AFR = 1 - exp(-8760 / MTBF) |
The exponential (constant failure rate) reliability model, 8,760 hours in a non-leap year | model |
| Sample size | drives >= UCL(f)/FFR and drives >= UCL(0)/(min(TBW,TBR) x 8e12 x UBER) |
The JEDEC SSD requirements: FFR and UBER shown at 60 percent confidence. The two-bound form follows the standard’s sample-size rule. The JESD218 text itself was not opened for this lab, so treat the form as a lead to check against the standard | model |
| UCL | Solve P(X <= k) = 1 - 0.6 for a Poisson mean, then round up to two decimals: 0.92, 2.03, 3.11 for 0, 1, 2 events |
Derived by the lab from the 60 percent rule | derived |
| Arrhenius | acceleration = exp((Ea/k)(1/T_use - 1/T_stress)) |
Arrhenius equation | model |
| Tmax | Set t_S [F e(T_SH) + (1-F) e(T_SL)] = t_U [F_U e(T_UH) + (1-F_U) e(T_UL)] and solve for T_SH, with e(T) = exp(-Ea/kT) |
The lab’s solution of the Arrhenius dose balance. Client Tmax comes out at 57.6 C, and a stress at 50 C needs a 100 hour delay at 67.3 C. These are computed here, not quoted from a standard | derived |
| Retention | RBER(t) = RBER0 + B0 x t^m, m usually 1 to 2 |
A power-law retention model | model |
Constants and presets
| Value | Where it comes from | Status |
|---|---|---|
| Client class: 40 C, 8 hours a day active, 1 year at 30 C retention, FFR at most 3%, UBER at most 1e-15 | A. Cox (Seagate, chair of JC-64.8), “JEDEC SSD Specifications Explained”, slides summarizing JESD218 | primary (author’s summary of the standard) |
| Enterprise class: 55 C, 24 hours a day, 3 months at 40 C retention, FFR at most 3%, UBER at most 1e-16 | Same deck | primary (author’s summary of the standard) |
| 60 percent statistical confidence | Same deck | primary |
| Ea = 1.1 eV for retention checks | Same deck, “temperature-accelerated mechanism (1.1eV)”. A JEDEC convention | primary (convention) |
| Ea = 1.04 eV for 3D NAND | Luo et al., “HeatWatch: Improving 3D NAND Flash Memory Device Reliability by Exploiting Self-Recovery and Temperature Awareness”, HPCA 2018 (fit to 3D charge-trap NAND data) | primary |
| 1,000 hours of direct endurance stress | Same Cox deck: extrapolation is allowed when the direct method needs more than 1,000 hours | primary |
| 8,766 hours in a year (365.25 days) for the use side of the Tmax balance | Arithmetic | derived |
| Boltzmann constant 8.617333e-5 eV/K | CODATA | primary |
| 8e12 bits per terabyte | 10^12 bytes x 8 bits | derived |
| MTBF 2.0 M h, Optane SSD DC P4800X | Intel ARK specifications page, “Mean Time Between Failures (MTBF) 2 million hours” | primary (vendor claim) |
| MTBF 2.0 M h, Micron 7450 | Micron 7450 product brief, “MTBF 2 million device hours” | primary (vendor claim) |
| MTBF 2.5 M h, Exos X20 hard drive | Seagate Exos X20 data sheet, “MTBF rating 2,500,000 hours” | primary (vendor claim) |
| MTBF 1.0 M h preset | The lab | teaching value |
| Codeword sizes of 512 B to 4 KiB, t from 1 to 120, RBER from 1e-6 to 1e-2 | The lab | teaching value |
| Fleet size of 1,000 drives, TBW of 100 TB | The lab | teaching value |
| Stress low-temperature lot at 25 C, half the stress hours at the high temperature | The lab | teaching value |
| RBER0 = 0, B0 = 7.95e-10, m = 1.1, ECC limit 4e-5, safety factor 2 | The lab, chosen so the curve crosses the design limit near 10,000 hours | teaching value |
What was checked
The tests recompute each published or derived figure on the page and in the walkthrough: 31 drives at FFR 3%, UBER 1e-16 and 100 TB (the FFR bound is 30.67 and the UBER bound 11.5); 0.92, 2.03 and 3.11 for the upper limits; 57.6 C for client Tmax; 67.3 C for the delay case; 0.96 years for 96 hours at 66 C; AFR of 0.437% at 2 M h; and a retention crossing near 10,000 hours.
Open items
- The JESD218 standard itself was not opened (JEDEC requires an account). The class table, the 60 percent rule, 1.1 eV and the 1,000 hour limit are from the author’s slide deck. The two-bound sample-size form and the Tmax equation structure should be checked against JESD218B before anyone cites this lab as following the standard.
- The retention panel has no measured data behind its starting values.